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Z-Contrast in a Conventional TEM
Published online by Cambridge University Press: 02 July 2020
Extract
Z-contrast produces an image that varies strongly with atomic number and offers limited chemical sensitivity. The annular dark field scanning transmission microscope (ADF-STEM) has recently been used to produce Z-contrast images at high resolution. In a STEM the electron beam is focused into a small probe at the specimen plane and scanned across the specimen. The electrons scattered at high angle are collected by an annular detector to produce a signal that approximately varies as Z11.5 to Z2. The only commercial supplier of dedicated STEM'S (VG-Microscopes, now Thermo) has recently discontinued production, so it is worth considering how to produce an equivalent Z-contrast image in a conventional transmission electron microscope (CTEM).
The reciprocity theorem states that the STEM and CTEM are equivalent if the source and detector are interchanged (reciprocity hold for all orders of elastic scattering so it is not necessary to restrict this discussion to weakly scattering specimens).
- Type
- Computational Methods for Microscopy
- Information
- Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1147 - 1148
- Copyright
- Copyright © Microscopy Society of America 1997
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