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Z-Contrast Scanning Transmission Electron Microscopy Of Nanometer-Scale Coated Particulate Materials

Published online by Cambridge University Press:  02 July 2020

H.J. Gao
Affiliation:
Department of Material Sciences and Engineering, University of Florida, Gainseville, FL32611 Solid Sate Division, Oak Ridge National Laboratory, Oak Ridge, TN37831
Y. Yan
Affiliation:
Solid Sate Division, Oak Ridge National Laboratory, Oak Ridge, TN37831
J. Fitz-Gerald
Affiliation:
Department of Material Sciences and Engineering, University of Florida, Gainseville, FL32611
D. Kumar
Affiliation:
Department of Material Sciences and Engineering, University of Florida, Gainseville, FL32611
R.K. Singh
Affiliation:
Department of Material Sciences and Engineering, University of Florida, Gainseville, FL32611
S.J. Pennycook
Affiliation:
Solid Sate Division, Oak Ridge National Laboratory, Oak Ridge, TN37831
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Extract

Particulate materials with unique functional properties have been the focus of much attention in recent years. Of particular interest, due to their considerable scientific and technological importance, are particles coated with nanoparticles. These have greatly stimulated interest for their novel structure and properties. In these kinds of particulate materials, the interface structures between the support particle and the nanoparticle play a crucial role in controlling their properties. Consequently, imaging of the atomic structures at the interfaces can provide deep understanding of the relationship between the particulate and the corresponding properties. Z-contrast scanning transmission electron microscope (STEM) provides a new view of materials on the atomic scale, a direct image of atomic structure composition which can be interpreted without the need for any preconceived model structure. Therefore it is a powerful tool in the study of particulate materials. In this report, we will present the structures of 18 micron diameter alumina particles coated with Ag nanoparticles.

Type
Nanophase and Amorphous Materials
Copyright
Copyright © Microscopy Society of America

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References

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