Advanced Sample Preparation Techniques Using Broad Ar Ion Beam for Optimum EBSD Acquisition

N Erdman; K Ogura; R Campbell

doi:10.1017/S1431927611002819

Advanced Sample Preparation Techniques Using Broad Ar Ion Beam for Optimum EBSD Acquisition

Published online by Cambridge University Press: 08 April 2017

N Erdman ,

K Ogura and

R Campbell

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N Erdman: Affiliation:
JEOL
K Ogura: Affiliation:
JEOL Ltd
R Campbell: Affiliation:
JEOL

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 388 - 389

DOI: https://doi.org/10.1017/S1431927611002819 [Opens in a new window]

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Advanced Sample Preparation Techniques Using Broad Ar Ion Beam for Optimum EBSD Acquisition

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