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Advanced Sample Preparation Techniques Using Broad Ar Ion Beam for Optimum EBSD Acquisition

Published online by Cambridge University Press:  08 April 2017

N Erdman ,
K Ogura  and
R Campbell
N Erdman
Affiliation:
JEOL
K Ogura
Affiliation:
JEOL Ltd
R Campbell
Affiliation:
JEOL

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 388 - 389
Copyright
Copyright © Microscopy Society of America 2011