Hostname: page-component-848d4c4894-5nwft Total loading time: 0 Render date: 2024-06-02T11:09:31.928Z Has data issue: false hasContentIssue false
  • English
  • Français

Advanced Surface Characterisation with X-ray Photoelectron Spectroscopy

Published online by Cambridge University Press:  01 August 2010

P Mack ,
TS Nunney ,
RG White ,
J Wolstenholme  and
A Wright
P Mack
Affiliation:
Thermo Fisher Scientific
TS Nunney
Affiliation:
Thermo Fisher Scientific
RG White
Affiliation:
Thermo Fisher Scientific
J Wolstenholme
Affiliation:
Thermo Fisher Scientific
A Wright
Affiliation:
Thermo Fisher Scientific

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 32 - 33
Copyright
Copyright © Microscopy Society of America 2010