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Advanced TEM characterization of new electrical contacts for high efficiency c-Si solar cells
Published online by Cambridge University Press: 25 July 2016
Abstract
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- Abstract
- Information
- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1624 - 1625
- Copyright
- © Microscopy Society of America 2016
References
References:
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Geissbühler, J, De Wolf, S., Faes, A., et al.,
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[5] Support is gratefully acknowledged from the Swiss National Science Foundation (project CRSII2_154474, “Impact of composition and nanometer scale DISorder in transparent Conductive Oxides: a new route to design materials with enhanced transport properties (DisCO)”), and the Department of Energy under the FPaceII project.Google Scholar