Hostname: page-component-7bb8b95d7b-qxsvm Total loading time: 0 Render date: 2024-09-27T00:42:16.421Z Has data issue: false hasContentIssue false
  • English
  • Français

Advancements in Interfaced SEM and Raman Spectromicroscopy (μRS)

Published online by Cambridge University Press:  25 July 2016

Sergey V. Prikhodko ,
Andrew King  and
Ioanna Kakoulli
Sergey V. Prikhodko
Affiliation:
Department of Materials Science and Engineering, UCLA, Los Angeles, CA
Andrew King
Affiliation:
Renishaw Inc. Spectroscopy Products Division, 5277 Trillium Blvd., Hoffman Estates, IL
Ioanna Kakoulli
Affiliation:
Department of Materials Science and Engineering, UCLA, Los Angeles, CA UCLA/Getty Conservation Program, Cotsen Institute of Archaeology, UCLA, Los Angeles, CA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 244 - 245
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Truchet, M & Delhaye, M J. Microsc. Spectrosc. Electron (1988) 13(2), 167–175.Google Scholar
[2] Sharma, B, et al, Materials Today (2012) 15, 16.Google Scholar
[3] Prikhodko, S.V, et al, J Raman Spectrosc 46 (2015) 632–635.Google Scholar