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Advances in EBSD sample preparation by broad ion beam milling

Published online by Cambridge University Press:  30 July 2021

Laurie Palasse
Affiliation:
Bruker Nano Analytics, Berlin, Berlin, Germany
Pawel Nowakowski
Affiliation:
E.A. Fischione Instruments, Inc., United States

Abstract

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Type
Vendor Symposium
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Kato, N. I. (2004). Reducing focused ion beam damage to transmission electron microscopy samples. Journal of Electron Microscopy, 53(5), 451-458. https://doi.org/10.1093/jmicro/dfh080CrossRefGoogle ScholarPubMed
Mayer, J., Giannuzzi, L. A., Kamino, T., & Michael, J. (2007). TEM sample preparation and FIB-induced damage. MRS Bulletin, 32(5), 400-407. https://doi.org/10.1557/mrs2007.63CrossRefGoogle Scholar
Saowadee, N., Agersted, K., & Bowen, J. (2012). Effects of focused ion beam Milling on electron backscatter diffraction patterns in strontium titanate and stabilized zirconia. Journal of Microscopy, 246(3), 279-286. https://doi.org/10.1111/j.1365-2818.2012.03616.xGoogle ScholarPubMed
Nowakowski, P., Wiezorek, J., Spinelli, I., Ray, M., & Fischione, P. (2019). Elastic and plastic strain measurement using electron backscatter diffraction technique: The influence of sample preparation. Microscopy and Microanalysis, 25(S2), 534-535. https://doi.org/10.1017/s1431927619003404CrossRefGoogle Scholar
Nowakowski, P., Schlenker, J., Ray, M., & Fischione, P. (2016). Sample preparation using broad argon ion beam Milling for electron backscatter diffraction (EBSD) analysis. Microscopy and Microanalysis, 22(S3), 12-13. https://doi.org/10.1017/s143192761600091xCrossRefGoogle Scholar
Giannuzzi, L., & Michael, J. (2020). Ion-induced transformation of metastable phases. Microscopy and Microanalysis, 26(S2), 792-793. https://doi.org/10.1017/s1431927620015858CrossRefGoogle Scholar
Bonifacio, C., Nowakowski, P., Costello, K., Ray, M., Morrison, R., & Fischione, P. (2019). Controlled environments from sample preparation to electron microscopy characterization. Microscopy and Microanalysis, 25(S2), 698-699. https://doi.org/10.1017/s1431927619004227CrossRefGoogle Scholar
Nowakowski, P., Bonifacio, C. S., Doux, J., Meng, S., Ray, M. L., Fischione, P. (2020, November). Gaining a better understanding of lithium ion battery functionality through scanning electron microscopy analytical studies [Conference session]. Materials Research Society 2020 Fall Meeting, Virtual, in press.Google Scholar