Article contents
Advances in Multi-Beam and Multi-Ion FIB-SEM for 3D Correlative Microscopy
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Advances in Focused Ion Beam Instrumentation and Techniques
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[1]Winiarski, B et al. , Supplement of Microscopy and Microanalysis 152 (2017), p. S4-S9.Google Scholar
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[5]Echlin, MP and Mottura, A et al. , Review of Scientific Instruments 83 (2012), p. 023701.Google Scholar
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