Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
2001.
Cerezo, Alfred
Clifton, Peter H.
Lozano-Perez, Sergio
Panayi, Peter
Sha, Gang
and
Smith, George D.W.
2007.
Overview: Recent Progress in Three-Dimensional Atom Probe Instruments and Applications.
Microscopy and Microanalysis,
Vol. 13,
Issue. 6,
p.
408.
Zhou, Yang
Booth-Morrison, Christopher
and
Seidman, David N.
2008.
On the Field Evaporation Behavior of a Model Ni-Al-Cr Superalloy Studied by Picosecond Pulsed-Laser Atom-Probe Tomography.
Microscopy and Microanalysis,
Vol. 14,
Issue. 6,
p.
571.
Moody, Michael P.
Gault, Baptiste
Stephenson, Leigh T.
Haley, Daniel
and
Ringer, Simon P.
2009.
Qualification of the tomographic reconstruction in atom probe by advanced spatial distribution map techniques.
Ultramicroscopy,
Vol. 109,
Issue. 7,
p.
815.
Schlesiger, Ralf
Oberdorfer, Christian
Würz, Roland
Greiwe, Gerd
Stender, Patrick
Artmeier, Michael
Pelka, Patrick
Spaleck, Frank
and
Schmitz, Guido
2010.
Design of a laser-assisted tomographic atom probe at Münster University.
Review of Scientific Instruments,
Vol. 81,
Issue. 4,
Booth-Morrison, Christopher
Zhou, Yang
Noebe, Ronald D.
and
Seidman, David N.
2010.
On the nanometer scale phase separation of a low-supersaturation Ni–Al–Cr alloy.
Philosophical Magazine,
Vol. 90,
Issue. 1-4,
p.
219.
Schmitz, G.
Ene, C.
Galinski, H.
Schlesiger, R.
and
Stender, P.
2010.
Nanoanalysis of interfacial chemistry.
JOM,
Vol. 62,
Issue. 12,
p.
58.
Houard, J.
Vella, A.
Vurpillot, F.
and
Deconihout, B.
2010.
Optical near-field absorption at a metal tip far from plasmonic resonance.
Physical Review B,
Vol. 81,
Issue. 12,
Gault, B.
Müller, M.
La Fontaine, A.
Moody, M. P.
Shariq, A.
Cerezo, A.
Ringer, S. P.
and
Smith, G. D. W.
2010.
Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography.
Journal of Applied Physics,
Vol. 108,
Issue. 4,
Schmitz, Guido
2010.
Nanotechnology.
p.
213.
Booth-Morrison, Christopher
Dunand, David C.
and
Seidman, David N.
2011.
Coarsening resistance at 400 °C of precipitation-strengthened Al–Zr–Sc–Er alloys.
Acta Materialia,
Vol. 59,
Issue. 18,
p.
7029.
Payne, David J.
and
Marquis, Emmanuelle A.
2011.
Three-Dimensional Spatial Distribution of Cr atoms in Doped Indium Oxide.
Chemistry of Materials,
Vol. 23,
Issue. 5,
p.
1085.
Dmitrieva, O.
Choi, P.
Gerstl, S.S.A.
Ponge, D.
and
Raabe, D.
2011.
Pulsed-laser atom probe studies of a precipitation hardened maraging TRIP steel.
Ultramicroscopy,
Vol. 111,
Issue. 6,
p.
623.
Bachhav, M. N.
Danoix, R.
Vurpillot, F.
Hannoyer, B.
Ogale, S. B.
and
Danoix, F.
2011.
Evidence of lateral heat transfer during laser assisted atom probe tomography analysis of large band gap materials.
Applied Physics Letters,
Vol. 99,
Issue. 8,
p.
084101.
Kelly, Thomas F.
2011.
Kinetic-Energy Discrimination for Atom Probe Tomography.
Microscopy and Microanalysis,
Vol. 17,
Issue. 1,
p.
1.
Hudson, D.
Smith, G.D.W.
and
Gault, B.
2011.
Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys.
Ultramicroscopy,
Vol. 111,
Issue. 6,
p.
480.
Agrawal, Ravi
Bernal, Rodrigo A.
Isheim, Dieter
and
Espinosa, Horacio D.
2011.
Characterizing Atomic Composition and Dopant Distribution in Wide Band Gap Semiconductor Nanowires Using Laser-Assisted Atom Probe Tomography.
The Journal of Physical Chemistry C,
Vol. 115,
Issue. 36,
p.
17688.
Hyde, J.M.
Burke, M.G.
Gault, B.
Saxey, D.Wf.
Styman, P.
Wilford, K.B.
and
Williams, T.J.
2011.
Atom probe tomography of reactor pressure vessel steels: An analysis of data integrity.
Ultramicroscopy,
Vol. 111,
Issue. 6,
p.
676.
Wedderhoff, K.
Kleint, C.A.
Shariq, A.
and
Teichert, S.
2011.
A study of nanoscale TiB2 precipitation during titanium silicidation using atom probe tomography.
Thin Solid Films,
Vol. 519,
Issue. 22,
p.
7826.
Prosa, T. J.
Clifton, P. H.
Zhong, H.
Tyagi, A.
Shivaraman, R.
DenBaars, S. P.
Nakamura, S.
and
Speck, J. S.
2011.
Atom probe analysis of interfacial abruptness and clustering within a single InxGa1−xN quantum well device on semipolar (101¯1¯) GaN substrate.
Applied Physics Letters,
Vol. 98,
Issue. 19,