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Advances in S/TEM Sample Preparation Using a FIB-SEM: Techniques for the Ultimate Sample

Published online by Cambridge University Press:  09 October 2013

B. Van Leer  and
D. Wall
B. Van Leer
Affiliation:
D. Wall
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 868 - 869
Copyright
Copyright © Microscopy Society of America 2013