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Advancing Atomic-Resolution TEM of Electron Beam-Sensitive Crystalline Materials from “Impossible” to “Routine”

Published online by Cambridge University Press:  05 August 2019

Daliang Zhang ,
Lingmei Liu ,
Yihan Zhu  and
Yu Han
Daliang Zhang
Affiliation:
King Abdullah University of Science and Technology, Thuwal, Saudi Arabia.
Lingmei Liu
Affiliation:
King Abdullah University of Science and Technology, Thuwal, Saudi Arabia.
Yihan Zhu
Affiliation:
King Abdullah University of Science and Technology, Thuwal, Saudi Arabia.
Yu Han*
Affiliation:
King Abdullah University of Science and Technology, Thuwal, Saudi Arabia.
*
*Corresponding author: yu.han@kaust.edu.sa

Abstract

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Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1676 - 1677
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Zhu, Y et al. , Nature Materials 16 (2017), p. 532.Google Scholar
[2]Zhang, D et al. , Science 359 (2018), p. 675.Google Scholar
[3]Wriedt, M et al. , J. Am. Chem. Soc. (2019) (accepted).Google Scholar
[4]Liu, L et al. , Nature Chemistry (2019) (accepted).Google Scholar