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Advancing the Hexapole Cs-Corrector for the Transmission Electron Microscope

Published online by Cambridge University Press:  30 July 2020

Thomas Riedel ,
Peter Hartel ,
Martin Linck ,
Volker Gerheim ,
Heiko Müller  and
Stephan Uhlemann
Thomas Riedel
Affiliation:
CEOS GmbH, Heidelberg, Baden-Wurttemberg, Germany
Peter Hartel
Affiliation:
CEOS GmbH, Heidelberg, Baden-Wurttemberg, Germany
Martin Linck
Affiliation:
CEOS GmbH, Heidelberg, Baden-Wurttemberg, Germany
Volker Gerheim
Affiliation:
CEOS GmbH, Heidelberg, Baden-Wurttemberg, Germany
Heiko Müller
Affiliation:
CEOS GmbH, Heidelberg, Baden-Wurttemberg, Germany
Stephan Uhlemann
Affiliation:
CEOS GmbH, Heidelberg, Baden-Wurttemberg, Germany

Abstract

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Type
Direct Phase Imaging with Coherent Electron Beam in TEM
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2150 - 2151
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Copyright
Copyright © Microscopy Society of America 2020

References

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Haider, M. and Müller, H., Hitachi Review Vol. 65, No. 7 (2016) 28–33.Google Scholar
Müller, H. et al. , Nucl. Instrum. Methods Phys. Res. A 645 (2011) 20–27.10.1016/j.nima.2010.12.091CrossRefGoogle Scholar
CEOS GmbH has received funding from the European Union's Horizon 2020 research and innovation program under grant agreement No. 823717 – ESTEEM3.Google Scholar