Hostname: page-component-7479d7b7d-qlrfm Total loading time: 0 Render date: 2024-07-12T14:45:53.177Z Has data issue: false hasContentIssue false
  • English
  • Français

An Adaptive Sparse Sampling Scheme for Scanning Electron Microscopy using Delauney Triangulation

Published online by Cambridge University Press:  05 August 2019

Tim Dahmen  and
Patrick Trampert
Tim Dahmen*
Affiliation:
German Research Center for Artificial Intelligence (DFKI), Saarbrücken, Germany.
Patrick Trampert
Affiliation:
German Research Center for Artificial Intelligence (DFKI), Saarbrücken, Germany. Saarland University, Saarbrücken, Germany
*
*Corresponding author: Tim.Dahmen@dfki.de

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 154 - 155
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Grosche, S et al. IEEE International Conference on Imaging Systems and Techniques (2018) p. 1-6.Google Scholar
[2]Dahmen, T et al. Scientific Reports 6 (2016) 25350.Google Scholar
[3]Boughorbel, F et al. Microsc. & Microanal. 23 S1 (2017) p. 150-151.Google Scholar