Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-29T19:35:20.480Z Has data issue: false hasContentIssue false
  • English
  • Français

An Advanced Quantitative Analysis of Li in LIB with AES Preparation For a Clean Cross Section with the Cross Section Polisher

Published online by Cambridge University Press:  27 August 2014

A. Tanaka ,
K. Tsutsumi ,
H. Onodera  and
T. Tazawa
A. Tanaka
Affiliation:
JEOL ltd., Musashino 3-1-2, Akishima, Tokyo, Japan
K. Tsutsumi
Affiliation:
JEOL ltd., Musashino 3-1-2, Akishima, Tokyo, Japan
H. Onodera
Affiliation:
JEOL ltd., Musashino 3-1-2, Akishima, Tokyo, Japan
T. Tazawa
Affiliation:
JEOL ltd., Musashino 3-1-2, Akishima, Tokyo, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 486 - 487
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Madden, H.H., et al., Journal of Vacuum Science and Technology, Vol. 14 (1977),412-415.Google Scholar
[2] Tsutsumi, K., et al., Journal of the Surface Science Society of Japan Vol. 33 (2012), No8, 431-436.Google Scholar