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An Investigation of X-ray Mapping/Imaging and the Artifacts Present Using a Silicon Drift Detector - Is Post-Collection Pile-Up Correction Essential?

Published online by Cambridge University Press:  08 April 2017

B Griffin ,
D Joy ,
J Michael  and
J Muhling
B Griffin
Affiliation:
University of Western Australia
D Joy
Affiliation:
Oak Ridge National Laboratory
J Michael
Affiliation:
Sandia National Laboratories
J Muhling
Affiliation:
The University of Western Australia

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 890 - 891
Copyright
Copyright © Microscopy Society of America 2011