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Analysis of Trace Forensic Evidence using Raman Microscopy

Published online by Cambridge University Press:  01 August 2003

B. Leimer ,
R. Garbutt ,
F. Weesner  and
J. Hodkiewicz
B. Leimer
Affiliation:
Thermo Electron Corporation, 355 River Oaks Pkwy, San Jose, CA 95134
R. Garbutt
Affiliation:
Sacramento Laboratory of Forensic Services, 4800 Broadway Ste 200Sacramento, CA 95820
F. Weesner
Affiliation:
Thermo Electron Corporation, 5225 Verona Rd, Madison, WI 53711
J. Hodkiewicz
Affiliation:
Thermo Electron Corporation, 5225 Verona Rd, Madison, WI 53711

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1124 - 1125
Copyright
Copyright © Microscopy Society of America 2003