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Analytical Aberration-Corrected STEM of Ferroelectric Functional Interfaces

Published online by Cambridge University Press:  01 August 2010

QM Ramasse ,
M Arredondo ,
M Weyland ,
R Mahjoub ,
I Vrejoiu ,
D Hesse ,
ND Browning ,
M Alexe ,
P Munroe  and
V Nagarajan
QM Ramasse
Affiliation:
SuperSTEM Laboratory, United Kingdom
M Arredondo
Affiliation:
University of New South Wales, Australia
M Weyland
Affiliation:
Monash University, Australia
R Mahjoub
Affiliation:
University of New South Wales, Australia
I Vrejoiu
Affiliation:
Max-Planck-Institute for Microstructure Physics, Germany
D Hesse
Affiliation:
Max-Planck-Institute for Microstructure Physics, Germany
ND Browning
Affiliation:
University of California-Davis
M Alexe
Affiliation:
Max-Planck-Institute for Microstructure Physics, Germany
P Munroe
Affiliation:
University of New South Wales, Australia
V Nagarajan
Affiliation:
University of New South Wales, Australia

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 82 - 83
Copyright
Copyright © Microscopy Society of America 2010