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Anin situMethod for Preserving Buried Voids and Cracks During TEM Sample Preparation using FIB
Published online by Cambridge University Press: 25 July 2016
Abstract
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 186 - 187
- Copyright
- © Microscopy Society of America 2016
References
[4] The authors thank Mr. Y. Fan and Dr. Z Liu for providing the composite specimens for evaluation.Google Scholar
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