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Applications of Electron Channeling Contrast Imaging (ECCI) in Failure Analysis of In-Situ Synchrotron X-Ray Diffraction Deformation Experiments

Published online by Cambridge University Press:  04 August 2017

Shirin Kaboli  and
Pamela C Burnley
Shirin Kaboli
Affiliation:
Geoscience Department and High Pressure Science and Engineering Center, University of Nevada Las Vegas, Las Vegas, United States.
Pamela C Burnley
Affiliation:
Geoscience Department and High Pressure Science and Engineering Center, University of Nevada Las Vegas, Las Vegas, United States.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 568 - 569
Copyright
© Microscopy Society of America 2017 

References

[1] Wang, Y, Durham, B, Getting, I & Weidner, D Rev. Sci. Instrum 74 2003). p. 3002.CrossRefGoogle Scholar
[2] Kaboli, S & Gauvin, R Ultramicroscopy 154 2015). p. 42.CrossRefGoogle Scholar
[3] Heuer, A, Lagerlof, K & Castaing, J Phil. Mag. A 78 1998). p. 747.CrossRefGoogle Scholar
[4] This research was sponsored by the National Science Foundation under award NSF-EAR13613399 Additional support was provided to the second author by the National Nuclear Security Administration under the Stewardship Science Academic Alliances program through DOE Cooperative Agreement #DE-NA0001982. Synchrotron experiments were performed at the Advanced Photon Source which is supported by DOE-BES, under Contract No. DE-AC02-06CH11357 at Sector 6BM which is supported by the Consortium for Materials Properties Research in Earth Sciences under NSF cooperative agreement EAR 06-49658.Google Scholar