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Applications of High Precision STEM Imaging to Structurally Complex Materials

Published online by Cambridge University Press:  04 August 2017

Jie Feng ,
Chenyu Zhang ,
Dan Zhou ,
Zhongnan Xu ,
Dane Morgan  and
Paul M. Voyles
Jie Feng
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WIUSA
Chenyu Zhang
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WIUSA
Dan Zhou
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WIUSA
Zhongnan Xu
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WIUSA
Dane Morgan
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WIUSA
Paul M. Voyles
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WIUSA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 418 - 419
Copyright
© Microscopy Society of America 2017 

References

[1] Yankovich, A. B., et al, Nat. Commun. 5 2014 4155.Google Scholar
[2] Sang, X. & Lebeau, J. M. Ultramicroscopy 138 2014 28.CrossRefGoogle Scholar
[3] Ophus, C., Ciston, J. & Nelson, C. T. Ultramicroscopy 162 2016 1.Google Scholar
[4] Yu, M., et al, ACS Nano 10 2016 4031.Google Scholar
[5] High precision STEM method development and imaging of vacancies was supported by the U.S. Department of Energy (DE-FG02-08ER46547). Reverse structure determination was supported by the U.S. National Science Foundation (DMR-1332851).Google Scholar