Hostname: page-component-84b7d79bbc-g78kv Total loading time: 0 Render date: 2024-07-28T08:24:19.733Z Has data issue: false hasContentIssue false
  • English
  • Français

Aquiring High-Quality Microscopic Images Through Silicon Without Damaging the Finished Product

Published online by Cambridge University Press:  01 August 2018

Robert Bellinger
Robert Bellinger*
Affiliation:
Product Application Manager, Olympus Corporation of the Americas, Scientific Solutions Group, 48 Woerd Avenue, Waltham, MA 02453, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1138 - 1139
Copyright
© Microscopy Society of America 2018