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ASTM Standards in the SEM

Published online by Cambridge University Press:  06 August 2003

John J. Friel
John J. Friel*
Affiliation:
Princeton Gamma-Tech, C/N 863, Princeton, NJ 08542

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 72 - 73
Copyright
Copyright © Microscopy Society of America 2003