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Atom Probe Tomography Analysis of a Gallium-Nitride-Based Commercial Light-Emitting Diode

Published online by Cambridge University Press:  09 October 2013

T.J. Prosa ,
D. Olson ,
A.D. Giddings ,
W. Lefebvre ,
P.H. Clifton  and
D.J. Larson
T.J. Prosa
Affiliation:
D. Olson
Affiliation:
A.D. Giddings
Affiliation:
W. Lefebvre
Affiliation:
P.H. Clifton
Affiliation:
D.J. Larson
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1014 - 1015
Copyright
Copyright © Microscopy Society of America 2013