Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-22T13:32:10.767Z Has data issue: false hasContentIssue false
  • English
  • Français

Atom Probe Tomography Characterization of Multilayer Films

Published online by Cambridge University Press:  21 July 2003

G.B. Thompson ,
H.L. Fraser  and
M. K. Miller
G.B. Thompson
Affiliation:
Materials Science and Engineering Department, Ohio State University, Columbus, OH 4321
H.L. Fraser
Affiliation:
Materials Science and Engineering Department, Ohio State University, Columbus, OH 4321
M. K. Miller
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-613

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 574 - 575
Copyright
Copyright © Microscopy Society of America 2003