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Atom Probe Tomography of Grain Boundaries in Ion Conducting Oxides

Published online by Cambridge University Press:  09 October 2013

D.R. Diercks
Affiliation:
B.P. Gorman
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013