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Atomic Configuration of Planar Defects in Multiferroic Ca-doped BiFeO3 Films

Published online by Cambridge University Press:  01 August 2010

MD Rossell ,
QM Ramasse ,
R Erni ,
C-H Yang  and
R Ramesh
MD Rossell
Affiliation:
ETH Zürich, Switzerland
QM Ramasse
Affiliation:
STFC Daresbury, United Kingdom
R Erni
Affiliation:
Swiss Federal Laboratories for Materials Testing and Research, Switzerland
C-H Yang
Affiliation:
Korea Advanced Institute of Science and Technology, Republic of Korea
R Ramesh
Affiliation:
University of California, Berkeley

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 96 - 97
Copyright
Copyright © Microscopy Society of America 2010