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Atomic Resolution Defect Analysis Using Low Angle ADF-STEM

Published online by Cambridge University Press:  09 April 2017

P Phillips ,
L Kovarik  and
M Mills
P Phillips
Affiliation:
Ohio State University
L Kovarik
Affiliation:
Pacific Northwest National Lab
M Mills
Affiliation:
Ohio State University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1304 - 1305
Copyright
Copyright © Microscopy Society of America 2011