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Atomic Resolution Dynamics of NiO Nano-Particle Studied by Low Dose In-line 3D Holography

Published online by Cambridge University Press:  05 August 2019

Fu-Rong Chen ,
Dirk Van Dyck ,
Christian Kisielowski  and
Hector Calderon
Fu-Rong Chen*
Affiliation:
Department of Materials Science and Engineering, City University of Hong Kong, Kowloon, Hong Kong.
Dirk Van Dyck
Affiliation:
EMAT, Department of Physics, University of Antwerp, Belgium
Christian Kisielowski
Affiliation:
Lawrence Berkeley National Laboratory, The Molecular Foundry and Joint center for Artificial Photosynthesis, One cyclotron Road, Berkeley California 94720USA
Hector Calderon
Affiliation:
Instituto Politécnico Nacional, ESFM, Departamento de Física, UPALM, CDMX, Mexico
*
*Corresponding author: frchen@cityU.edu.hk

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 462 - 463
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Helveg, S., Kisielowski, C.F., Jinschek, J.R., Specht, P., Yuan, G., Frei, H., Micron 68 (2014) 176–185.Google Scholar
[2]Kisielowski, C., Specht, P., Gygax, S.M., Barton, B., Calderon, H.A., Kang, J.H., Cieslinski, R., Micron 68 (2014) 186–19Google Scholar
[3]Van Dyck, Dirk, Jinschek, Joerg R. & Chen, Fu-Rong, NATURE, 486 (2012) 243Google Scholar
[4]Chen, F.-R., Van Dyck, D. & Kisielowski, C., NATURE COMMUNICATIONS | 7:10603 | DOI: 10.1038/ncomms10603 |Google Scholar