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Atomic Scale Studies of the Electronic Properties of CMR Manganese Oxides

Published online by Cambridge University Press:  01 August 2005

M Varela ,
V Peña ,
Z Sefrioui ,
W Tian ,
A R Lupini ,
D G Mandrus ,
J Santamaria  and
S J Pennycock
M Varela
Affiliation:
Oak Ridge National Laboratory
V Peña
Affiliation:
Universidad Complutense de Madrid.
Z Sefrioui
Affiliation:
Universidad Complutense de Madrid.
W Tian
Affiliation:
Oak Ridge National Laboratory
A R Lupini
Affiliation:
Oak Ridge National Laboratory
D G Mandrus
Affiliation:
Oak Ridge National Laboratory
J Santamaria
Affiliation:
Universidad Complutense de Madrid.
S J Pennycock
Affiliation:
Oak Ridge National

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 1432 - 1433
Copyright
© 2005 Microscopy Society of America