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Atomic Scale Tracking of a Charge Order Transition with Continuously Variable Temperature Cryo-STEM
Published online by Cambridge University Press: 30 July 2020
Abstract
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- Type
- In situ TEM at the Extremes - Extreme Temperature and Biasing
- Information
- Copyright
- Copyright © Microscopy Society of America 2020
References
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This work was supported by AFOSR (FA 9550-16-1-0305) and NSF (DMR-1539918, DMR-1429155, DMR-1719875).Google Scholar