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Atomically Resolved 3D Shape Determination of a MgO Crystal Using a Single Aberration Corrected HRTEM Image

Published online by Cambridge University Press:  27 August 2014

Chun-Lin Jia ,
Shao-Bo Mi ,
Juri Barthel ,
Dawei Wang ,
Rafal E. Dunin-Borkowski ,
Knut W. Urban  and
Andreas Thust
Chun-Lin Jia
Affiliation:
International Center of Dielectric Research, The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
Shao-Bo Mi
Affiliation:
International Center of Dielectric Research, The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China
Juri Barthel
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany Central Facility for Electron Microscopy, RWTH Aachen University, Ahornstr. 55, 52074 Aachen, Germany
Dawei Wang
Affiliation:
International Center of Dielectric Research, The School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China
Rafal E. Dunin-Borkowski
Affiliation:
Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
Knut W. Urban
Affiliation:
Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
Andreas Thust
Affiliation:
Peter Grünberg Institute, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 940 - 941
Copyright
Copyright © Microscopy Society of America 2014 

References

References:

[1] Urban, K.W. Science 321 (2008). p. 506.Google Scholar
[2] Uhlemann, S. et al, Phys. Rev. Lett. 111 (2013) 046101.10.1103/PhysRevLett.111.046101Google Scholar
[3] Jia, C.-L. et al, Microsc. Microanal. 19 (2013) p. 310.Google Scholar
[4] Thust, A. Phys. Rev. Lett. 102 (2009) 220801.10.1103/PhysRevLett.102.220801Google Scholar