Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-28T11:40:56.403Z Has data issue: false hasContentIssue false
  • English
  • Français

Atomically Resolved Local Structure of Conductive Domain Walls in Ferroelectric BiFeO3.

Published online by Cambridge University Press:  25 July 2016

A. Bencan ,
G. Drazic ,
H. Ursic ,
N. Sakamoto ,
B. Jancar ,
G. Tavcar ,
M. Makarovic ,
J. Walker ,
B. Malic  and
D. Damjanovic
...Show all authors
A. Bencan
Affiliation:
Electronic Ceramics Department, Jozef Stefan Institute, Ljubljana, Slovenia
G. Drazic
Affiliation:
Laboratory for Materials Chemistry, National Institute of Chemistry, Ljubljana, Slovenia
H. Ursic
Affiliation:
Electronic Ceramics Department, Jozef Stefan Institute, Ljubljana, Slovenia
N. Sakamoto
Affiliation:
Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan
B. Jancar
Affiliation:
Advanced Materials Department, Jozef Stefan Institute, Ljubljana, Slovenia
G. Tavcar
Affiliation:
Department of Inorganic Chemistry and Technology, Jozef Stefan Institute, 1000 Ljubljana, Slovenia
M. Makarovic
Affiliation:
Electronic Ceramics Department, Jozef Stefan Institute, Ljubljana, Slovenia
J. Walker
Affiliation:
Electronic Ceramics Department, Jozef Stefan Institute, Ljubljana, Slovenia
B. Malic
Affiliation:
Electronic Ceramics Department, Jozef Stefan Institute, Ljubljana, Slovenia
D. Damjanovic
Affiliation:
Ceramics Laboratory, Swiss Federal Institute of Technology–EPFL, Switzerland
T. Rojac
Affiliation:
Electronic Ceramics Department, Jozef Stefan Institute, Ljubljana, Slovenia

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1828 - 1829
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Rojac, T., et al, Adv. Funct. Mater 25 (2015). p. 2099.Google Scholar
[2] Gureev, M.Y., Tagantsev, A.K. & Setter, N. Phy. Rev. B 83 (2011). p. 184104.Google Scholar
[3] This work was supported by the Slovenian Research Agency (P2-0105 and J2-5483).Google Scholar