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Atomic-Resolution EELS in Aberration-Corrected STEM

Published online by Cambridge University Press:  24 July 2003

S. D. Findlay ,
M. P. Oxley ,
L. J. Allen ,
A. R. Lupini  and
S. J. Pennycook
S. D. Findlay
Affiliation:
School of Physics, University of Melbourne, Victoria 3010, Australia
M. P. Oxley
Affiliation:
School of Physics, University of Melbourne, Victoria 3010, Australia
L. J. Allen
Affiliation:
School of Physics, University of Melbourne, Victoria 3010, Australia
A. R. Lupini
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6030 USA
S. J. Pennycook
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6030 USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 852 - 853
Copyright
Copyright © Microscopy Society of America 2003