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Atomic-Resolution Investigation of Irradiation-Induced Defects in Silicon Carbide
Published online by Cambridge University Press: 27 August 2014
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- Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1042 - 1043
- Copyright
- Copyright © Microscopy Society of America 2014
References
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[7] Research sponsored by Office of Fusion Energy Sciences (YK, CMP) and Nuclear Energy University Partnerships (TK), US Department of Energy. Research supported as part of a user proposal through ORNL’s Center for Nanophase Materials Sciences (CNMS), which is sponsored by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy.Google Scholar