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Atomic-Resolution X-ray Analysis in Aberration-Corrected Scanning Transmission Electron Microscopes: Current Limits and Challenges toward Quantification

Published online by Cambridge University Press:  27 August 2014

M. Watanabe
M. Watanabe*
Affiliation:
Dept of Materials Science and Engineering, Lehigh University, Bethlehem. PA 18015

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 2168 - 2169
Copyright
Copyright © Microscopy Society of America 2014 

References

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[2] Ohnishi, I., et al, Microsc. Microana. 17 (2011), Suppl. 2, 22.Google Scholar
[3] Watanabe, M. and Williams, D.B. J. Microsc. 221 (2006), 89.Google Scholar
[4] Bullock, J.F., et al., Microscopy in Semiconductor Materials 1985, 405 (1985).Google Scholar
[5] Forbes, B.D., et al., Allen, Phys. Rev. B 86, 024108 (2012).Google Scholar
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[7] The author wishes to acknowledge financial supp ort from the NSF through grants DMR-0804528 and DMR-1040229.Google Scholar