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Atomic-Scale Characterization of Metals and Alloys Using Spherical-Aberration Corrected Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  31 July 2006

D Williams  and
M Watanabe
D Williams
Affiliation:
Lehigh University
M Watanabe
Affiliation:
Lehigh University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1344 - 1345
Copyright
© 2006 Microscopy Society of America