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Automated Electron Beam Manipulation for Controlled Materials Transformations

Published online by Cambridge University Press:  30 July 2021

Nicole Creange ,
Kevin Roccapriore ,
Ondrej Dyck ,
Andy Lupini ,
Rama Vasudevan  and
Sergei V. Kalinin
Nicole Creange
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Kevin Roccapriore
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Ondrej Dyck
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Andy Lupini
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Rama Vasudevan
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Sergei V. Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

Abstract

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Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2530 - 2532
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Pennycook, S. J., et al. , in Advances in Imaging and Electron Physics, Vol 153, (2008), p. 327.CrossRefGoogle Scholar
Pennycook, S. J., et al. , Journal of Electron Microscopy 58 (2009), 87.CrossRefGoogle Scholar
Jiang, Y., et al. , Nature 559 (2018), p. 343.Google Scholar