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Breaking the Rayleigh Limit in Thick Samples with Multi-slice Ptychography

Published online by Cambridge University Press:  01 August 2018

Yi Jiang ,
Zhen Chen ,
Ismail El Baggari ,
Lena F. Kourkoutis ,
Veit Elser  and
David A. Muller
Yi Jiang
Affiliation:
Department of Physics, Cornell University, Ithaca, NY
Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY
Ismail El Baggari
Affiliation:
Department of Physics, Cornell University, Ithaca, NY
Lena F. Kourkoutis
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY
Veit Elser
Affiliation:
Department of Physics, Cornell University, Ithaca, NY
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 192 - 193
Copyright
© Microscopy Society of America 2018 

References

[1] Tate, M., et al, Microscopy and Microanalysis 22 2016) p. 237.Google Scholar
[2] Jiang, Y., et al arXiv: 1801.04630[cond.Mat].Google Scholar
[3] Maiden, A. M., et al, Journal of the Optical Society of America A 8 2012) p. 1606.Google Scholar
[4] Work supported by DOE (DE-SC0005827) & NSF (DMR-1719875, DMR-1429155, DMR-1539918). NbsCh sample provided by J. P. Sheckelton, C. Pasco, T. M. McQueen (Johns Hopkins University).Google Scholar