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Carbon Nanotube Electrostatic Biprism: Principle of Operation and Proof of Concept

Published online by Cambridge University Press:  01 August 2004

John Cumings ,
A. Zettl  and
M.R. McCartney
John Cumings
Affiliation:
Department of Physics, University of California at Berkeley and Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
A. Zettl
Affiliation:
Department of Physics, University of California at Berkeley and Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
M.R. McCartney
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ 85287-1504, USA
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Abstract

During in situ transmission electron microscopy (TEM) field emission experiments, carbon nanotubes are observed to strongly diffract the imaging TEM electron beam. We demonstrate that this effect is identical to that of a standard electrostatic biprism. We also demonstrate that the nanotube biprism can be used to capture electron-holographic information.

Keywords

nanotubecarbon nanotubebiprismelectrostatic biprismholographyelectron holographyfield emission
Type
Instrumentation and Techniques
Information
Microscopy and Microanalysis , Volume 10 , Issue 4 , August 2004 , pp. 420 - 424
Copyright
© 2004 Microscopy Society of America

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References

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