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Characterisation of Misfit Dislocations at Semicoherent Interfaces in Biphasic Functional Heusler Intermetallics

Published online by Cambridge University Press:  05 August 2019

YM Eggeler ,
EE Levin ,
F Wang ,
R Seshadri ,
TM Pollock  and
DS Gianola
YM Eggeler*
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA. Materials Research Laboratory, University of California, Santa Barbara, CA, USA.
EE Levin
Affiliation:
Materials Research Laboratory, University of California, Santa Barbara, CA, USA.
F Wang
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA. Materials Research Laboratory, University of California, Santa Barbara, CA, USA.
R Seshadri
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA. Materials Research Laboratory, University of California, Santa Barbara, CA, USA.
TM Pollock
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA. Materials Research Laboratory, University of California, Santa Barbara, CA, USA.
DS Gianola
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA. Materials Research Laboratory, University of California, Santa Barbara, CA, USA.
*
*Corresponding author: yolita@ucsb.edu

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1916 - 1917
Copyright
Copyright © Microscopy Society of America 2019 

References

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[5]Pochet, P et al. , Applied Materials Today (2017), p. 240.Google Scholar