Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-26T18:35:27.308Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization of Dielectric Waveguides Through Photoemission Electron Microscopy (PEEM) in the Infrared Regime

Published online by Cambridge University Press:  23 September 2015

T. A. Stenmark ,
Robert C. Word  and
R. Konenkamp
T. A. Stenmark
Affiliation:
Department of Physics, Portland State University, Portland, OR 97201, USA
Robert C. Word
Affiliation:
Department of Physics, Portland State University, Portland, OR 97201, USA
R. Konenkamp
Affiliation:
Department of Physics, Portland State University, Portland, OR 97201, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1589 - 1590
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Fitzgerald, JPS, Word, RC & Konenkamp, R, Phys. Rev. B 89 (2014) 195129.Google Scholar
[2] (6) Livio, I. & Chelaru, F.-J., Meyer zu Heringdorf. Appl. Phys. Lett 89, 241908 (2006).Google Scholar
[3] Fitzgerald, JPS, Word, RC & Konenkamp, R, Phys. Rev B87 (2013) 205419.CrossRefGoogle Scholar
[4] Yariv, A., Optical Electronics. (Saunders College Publishing, Philadelphia, 1991).Google Scholar
[5] Niemma, M., Buckanie et al. Ultramicroscopy 130, 49 (2013).Google Scholar