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Characterization of Laser Ablation Dynamics for Nickel Thin Films on Silicon Using Movie Mode Dynamic TEM
Published online by Cambridge University Press: 23 September 2015
Abstract
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- Abstract
- Information
- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1591 - 1592
- Copyright
- Copyright © Microscopy Society of America 2015
References
[1]
Sugioka, K., et al, Laser Precision Microfabrication. (Springer, Berlin Heidelberg), 2010). p 91–120.Google Scholar
[4]
Hihath, S., Santala, Melissa, Campbell, Geoffrey & van Benthem, Klaus (submitted for publication).Google Scholar
[7] This work was supported by a University of California Laboratory Fee grant (#12-LR-238313). DTEM experiments at Lawrence Livermore National Laboratory were carried out under the auspices of the US Department of Energy, Office of Basic Energy Sciences under contract DE-AC52-07NA27344.Google Scholar