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Characterization of Materials Properties by EBSD, EDS and AFM

Published online by Cambridge University Press:  01 August 2018

J. Goulden ,
P. Pinard ,
A. Gholinia ,
M. Kocun  and
R. Proksch
J. Goulden
Affiliation:
Oxford Instruments NanoAnalysis, Halifax Road, High Wycombe, HP12 3SE, UK
P. Pinard
Affiliation:
Oxford Instruments NanoAnalysis, Halifax Road, High Wycombe, HP12 3SE, UK
A. Gholinia
Affiliation:
School of Materials, University of Manchester, Manchester, UK
M. Kocun
Affiliation:
Asylum Research, an Oxford Instruments Company, Santa Barbara, CA 93117USA
R. Proksch
Affiliation:
Asylum Research, an Oxford Instruments Company, Santa Barbara, CA 93117USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 594 - 595
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Humphreys, FJ Journal of Materials Science 36 2001 3833.Google Scholar
[2] Mainprice, D, et al, Geological Society Special Publications 409 2015 223.Google Scholar
[3] Jain, A, et al, APL Materials 1 2013 011002.Google Scholar
[4] Kocun, M., et al., ACSNano 2017 11(10 pp 10097–10105. DOI: 10.1021/acsnano.7b04530.Google Scholar