Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-26T04:21:58.339Z Has data issue: false hasContentIssue false

Characterization of N-polar GaN/AlGaN/GaN Heterostructures Using Electron Holography

Published online by Cambridge University Press:  27 August 2014

A. Boley
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287
D. F. Storm
Affiliation:
Naval Research Laboratory, Washington, DC 20375
M.R. McCartney
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287
D. J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Mishra, U.K., et al. Proc. IEEE 90 2002). 1022.Google Scholar
[2] Rajan, S., et al. J. Appl. Phys.102 2007) 044501.Google Scholar
[3] Wong, M.H., et al. Semicond. Sci. Technol. 28 2013) 074009.Google Scholar
[4] Smith, D.J., et al. Microelectron. Reliab. 50 2010) 1514.Google Scholar
[5] Dimitrov, R., et al. J. Appl. Phys. 87 2000) 375.Google Scholar
[6] McCartney, M.R. and Smith, D.J. Annu. Rev. Mater. Res. 37 2007) 729.Google Scholar
[7] The recent work at ASU was supported under contract to Wyle Laboratories as part of RIAC Contract HC1047-05-D-4005. We gratefully acknowledge the use of facilities within the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University.Google Scholar