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Characterization of Oxide Layers on Stainless Steel Using Auger Electron Spectroscopy (AES), Scanning Electron Microscopy-Focused Ion Beam (SEM-FIB) and Transmission Electron Microscopy (TEM)

Published online by Cambridge University Press:  30 July 2020

Henry Ajo
Henry Ajo*
Affiliation:
SRNL, Aiken, South Carolina, United States

Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Surface Analysis and Spectroscopy I - Chemical State, Kinetics and Reactions
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1566
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Copyright
Copyright © Microscopy Society of America 2020

References

Adams, R.O. (1983). A Review of the Stainless-Steel Surface. J. Vac. Sci. Technol. A 1, 12–18.10.1116/1.572301CrossRefGoogle Scholar
Ajo, Henry & Blankenship, Donnie & Clark, Elliot. (2014). Analysis of Passivated A-286 Stainless Steel Surfaces for Mass Spectrometer Inlet Systems by Auger Electron and X-ray Photoelectron Spectroscopy and Scanning Electron Microscopy. Metallogr., Microstruct., Anal.3, 263–271.10.1007/s13632-014-0151-7CrossRefGoogle Scholar