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Characterization of the holography performance of a Titan 80-300 with high brightness Schottky electron gun and image Cs-corrector at 300kV acceleration voltage

Published online by Cambridge University Press:  26 July 2009

B Freitag ,
S Kujawa ,
M Linck ,
D Geiger ,
T Niermann ,
M Lehmann  and
H Lichte
B Freitag
Affiliation:
FEI Company,Netherlands
S Kujawa
Affiliation:
FEI Company,Netherlands
M Linck
Affiliation:
Technische Universität Dresden,Germany
D Geiger
Affiliation:
Technische Universität Dresden,Germany
T Niermann
Affiliation:
Technische Universität Dresden,Germany
M Lehmann
Affiliation:
Technische Universität Dresden,Germany
H Lichte
Affiliation:
Technische Universität Dresden,Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1098 - 1099
Copyright
Copyright © Microscopy Society of America 2009