No CrossRef data available.
Article contents
Characterizing Epitaxial Growth of Nd2Ir2O7Pyrochlore Thin Films via HAADF-STEM Imaging and EDX
Published online by Cambridge University Press: 25 July 2016
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927616008837/resource/name/firstPage-S1431927616008837a.jpg)
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1598 - 1599
- Copyright
- © Microscopy Society of America 2016
References
[1]
Bendt, G., Zastrow, S., Nielsch, K., et al.,
J. Mater. Chem. A
2
(2014)
8215–8222.Google Scholar
[4]
Witczak-Krempa, W., Chen, G., Kim, Y. B., et al.,
Annu. Rev. Condens. Matter Phys
5
(2014)
57–82.Google Scholar
[7] Funding for this research was provided by the Center for Emergent Materials at the Ohio State University, an NSF MRSEC (Award Number DMR-1420451).Google Scholar