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Combined EELS and XAS Analysis of the Relationship between Depth Dependence and Valence in LSMO Thin Films
Published online by Cambridge University Press: 04 August 2017
Abstract
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- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1600 - 1601
- Copyright
- © Microscopy Society of America 2017
References
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[9] This work is supported by the National Science Foundation (DMR-1608656). The authors also acknowledge the Analytical Instrumentation Facility (AIF) at North Carolina State University, which is supported by the State of North Carolina and the National Science Foundation..Google Scholar