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Combined focused ion beam and secondary ion mass spectrometry for high resolution light element detection applied on Li-Ion batteries

Published online by Cambridge University Press:  30 July 2021

Gudrun Wilhelm ,
Ute Golla-Schindler ,
Katharina Wöhrl ,
Christian Geisbauer ,
Graham Cooke ,
Timo Bernthaler  and
Gerhard Schneider
Gudrun Wilhelm
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, Aalen, Baden-Wurttemberg, Germany
Ute Golla-Schindler
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, Aalen, Germany
Katharina Wöhrl
Affiliation:
Abteilung ZAF/CARISSMA, Technische Hochschule Ingolstadt, Ingolstadt, Germany, Ingolstadt, Bayern, Germany
Christian Geisbauer
Affiliation:
Abteilung ZAF/Carissima, Technische Hochschule Ingolstadt, Ingolstadt, Germany, Aalen, Bayern, Germany
Graham Cooke
Affiliation:
Hiden Analytical GmbH, Düsseldorf, Germany, Germany
Timo Bernthaler
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, United States
Gerhard Schneider
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany, United States

Abstract

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Type
Advances in Focused Ion Beam Instrumentation, Applications and Techniques in and Materials and Life Sciences
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1012 - 1015
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Golla-Schindler, U, Zeibig, D, Prickler, L, Behn, S, Bernthaler, T, Schneider, G 2018 Micron 113 10–19CrossRefGoogle Scholar