No CrossRef data available.
Article contents
Combining Atomic-Scale EDX with Inelastic Multislice Simulations for Quantitative Chemical Analysis of AlGaN/GaN 1 nm-thick Quantum Wells
Published online by Cambridge University Press: 22 July 2022
Abstract
An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS1431927622009771/resource/name/firstPage-S1431927622009771a.jpg)
- Type
- Advanced Imaging and Spectroscopy for Nanoscale Materials
- Information
- Copyright
- Copyright © Microscopy Society of America 2022
References
Asif Khan, M. et al. , Jpn. J. Appl. Phys. 44 (2005) 7191–7206. https://doi.org/10.1143/JJAP.44.7191.CrossRefGoogle Scholar
Liu, J., Microsc Microanal. 27 (2021) 943–995. https://doi.org/10.1017/S1431927621012125.CrossRefGoogle Scholar
Lugg, N.R. et al. , Ultramicroscopy. 151 (2015) 150–159. https://doi.org/10.1016/j.ultramic.2014.11.029.CrossRefGoogle Scholar
Nguyen, D.T., Findlay, S.D., Etheridge, J., Ultramicroscopy. 146 (2014) 6–16. https://doi.org/10.1016/j.ultramic.2014.04.008.CrossRefGoogle Scholar
Allen, L.J., D׳Alfonso, A.J., Findlay, S.D., Ultramicroscopy. 151 (2015) 11–22. https://doi.org/10.1016/j.ultramic.2014.10.011.CrossRefGoogle Scholar
This work, done on the NanoCharacterisation PlatForm (PFNC), was supported by the “Recherches Technologiques de Base” Program of the French Ministry of Research.Google Scholar